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[1] [2] [3] [4] [5] G. Taguchi, Experimental Designs, 3rd ed., Vol. 1 (in Japanese), Maruzen Publishing Company, Tokyo, Japan, 1976. G. Taguchi, Experimental Designs, 3rd ed., Vol. 2, (In Japanese), Maruzen Publishing Company, Tokyo, Japan, 1977. G. Taguchi, Off-Line and On-Line Quality Control System, Proceedings of International Conference on Quality Control, Tokyo, Japan, 1978. J. M. Juran, Quality Control Handbook, 3rd ed., McGraw-Hill, New York, 1979. R. K. Brayton, S. W. Director, and G. D. Hachtel, Yield Maximization and Worst-Case Design with Arbitrary Statistical Distributions, IEEE Transactions on Circuits and Systems, CAS 27, 1908, pp. 756 764. Raghu N. Kackar, Off-Line Quality Control, Parameter Design, and the Taguchi Method, Journal of Quality Technology, Vol. 17, No. 4, October 1985, pp. 176 188. Victor E. Kane, Process Capability Indices, Journal of Quality Technology, Vol. 18, No. 1, January 1986, pp. 41 52. Jonghae Kim, Jean-Olivier Plouchart, and Noah Zamdmer, Design and Manufacturability Aspect of SO1 CMOS RFICs, IEEE 2004 Custom Integrated Circuits Conference, 2004, pp. 541 548. Richard C. Li, Key Issues in RF/RFIC Circuit Design, Higher Education Press, Beijing, 2005.

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This section walks you through the entire Windows 7 setup process, using Microsoft s Interactive Setup Wizard. This application was completely overhauled for Windows Vista and then further streamlined for Windows 7, and it s now much simpler and faster-moving, especially when compared to the version used in Windows XP. Follows these steps to install Windows 7 as a clean install: 1. Insert the Windows 7 DVD in your PC s optical drive and reboot the system. After the BIOS screen flashes by, you may see a message alerting you to press any key to boot from the CD or DVD. If so, press a key. Some systems, however, do not provide this warning and instead boot from the DVD by default. A black screen with a pulsating Windows logo and the text Starting Windows will appear, as shown in Figure 2-1.

If the server has completely failed and all the backups must be restored onto a new server, this is the process to follow: 1. Build the Windows server and restore the domain logins to support Windows authentication. 2. Install SQL Server and any service-pack upgrades. 3. Put SQL Server in single-user mode and restore the master database. 4. Restore the msdb database. 5. If the model database was modified, restore it. 6. Restore the user databases.

ESE technology is widely used throughout Microsoft products. It uses a version of the Jet database engine (the same technology found in the Exchange Serve mail product, part of the BackOffice suite) and is also the underlying technology of the Windows Internet Name Service.

(b) Central frequency is moved to higher frequency with constant bandwidth as the control voltage is increased

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FUTURE PERSPECTIVES to it during the calibration The large number of calibration samples required and the empirical aspect related to it, is certainly the major drawback of PLS for its application in XRF However, with the availability of excellent MC simulation codes this problem can be overcome by using simulated spectra Virtually any composition in accordance with an experimental design can then be chosen Another drawback remains, due to matrix effects encountered with XRF spectrometry, the relationship between intensities of element characteristic lines and the element concentrations are in part nonlinear PLS, being in essence a linear method able to handle only a certain degree of nonlinearity is probably less suited for XRF than for IR or UV spectrometry Wang et al (1990) applied the PLS method for the analysis of nickel alloy samples employing WD-XRF.

The authors used the instrument in scan mode to acquire a spectrum of each sample Each spectrum consisted of 261 channels and the total measuring time was 7830 s (30 s per channel) Adams and Allen (1998) reported on the application of PLS to WD-XRF in combination with variable selection for the analysis of ironbased alloys, copper-based alloys and geological samples Swerts et al (1993) were the rst to apply PLS in combination with ED-XRF for the analysis of sulfur graphite mixtures The PLS method was used both for the analysis of sulfur and the explanation of various artifacts observed in the spectra Later, Urbanski and Kowalska (1995) applied the PLS method to various lowresolution ED-XRF analyses Lemberge and Van Espen (1999) used the PLS method for the determination of Ni, Cu and As in liquid samples.

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